Alexandra Meliou wins ACM SIGSOFT Distinguished Artifact Award at ICSE 2020.
Causal Testing: Understanding Defects’ Root Causes.
Authors: Brittany Johnson, Yuriy Brun, Alexandra Meliou.
July 20, 2020
July 20, 2020
Alexandra Meliou wins ACM SIGSOFT Distinguished Artifact Award at ICSE 2020.
Causal Testing: Understanding Defects’ Root Causes.
Authors: Brittany Johnson, Yuriy Brun, Alexandra Meliou.