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Alexandra Meliou wins ACM SIGSOFT Distinguished Artifact Award

July 20, 2020 Award, Highlight

Alexandra Meliou wins ACM SIGSOFT Distinguished Artifact Award at ICSE 2020.

Causal Testing: Understanding Defects’ Root Causes.
Authors: Brittany Johnson, Yuriy Brun, Alexandra Meliou.

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← Marco Serafini got two papers accepted to VLDB 2020
Cen Wang’s paper was accepted to WSC 2020 →

News Highlights

  • Alexandra Meliou will be PC Chair for SIGMOD 2024

    September 21, 2022
  • Marco Serafini receives NSF grant for Graph Neural Network training

    September 13, 2022
  • Peter Haas and Alexandra Meliou receive NSF grant for in-database optimization

    August 30, 2022
  • Ryan McKenna and Brett Mullins’ paper accepted to VLDB 2022

    August 11, 2022
  • Chenghao Lyu’s paper accepted to VLDB 2022

    July 7, 2022
  • Ryan McKenna’s paper was accepted to NeurIPS 2021

    January 26, 2022
  • Maliha Tashfia Islam’s paper accepted to SIGMOD 2022

    January 26, 2022
  • Zafeiria Moumoulidou’s paper was accepted to ICDT 2022

    January 26, 2022

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